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16 APRIL 2004
RADIATION LEVEL FOR THE FINAL ATLAS LAYOUT GEOMETRY January 2003 Simulation Radiation Levels
UPDATE OF MUON TGC ELECTRONICS (FDR 01/03/01) click here
1. Overview
of the ATLAS Radiation Hardness Assurance Plan
2. ATLAS
Policy on Radiation Tolerant Electronics
3. Radiation
Constraints, Safety Factors and Radiation Tolerance Criteria
4. Standard
Test Methods and Standard Report Forms
5. Radiation
Facilities and Radiation Campaigns Agenda
6. CERN
RADTOL Components Data Base
7. ATLAS
Radiation Hardness Assurance Working Group (RHAWG)
8. Radiation
Hardness Assurance made by ATLAS Systems
9. Tutorials
on Radiation Effects
10. Workshops
and Conferences
11. E.U.
and U.S. Standard Radiation Tests Procedures
12. Related
Web Sites
ATLAS has agreed a Quality Assurance plan dedicated to the radiation hardness of its electronics, whose aims are:
1. The effects of radiation on
electronics should have no consequences on the safety of the persons and
of the global experiment. In other words, they should
not induce any risks
for the people working on irradiated electronics, and no fire risks.
2. The electronic systems should be built
in such a way they remain in conformity with their specifications during
10 years of operation in their specific radiation
environment. This can be
obtained either by designing radiation tolerant systems, or by designing
less robust systems but forseeing their
replacement after a certain
period of time.
The ATLAS radiation hardness assurance plan is based on three foundations:
1. A good knowledge on the effects
of radiation on electronic components and circuits, distributed thoughout
in the ATLAS collaboration.
This knowledge was reinforced
owing to tutorial courses given in 1999 and 2000
in some of the Institutes and at CERN.
2. A central co-ordination of
the work made by the Sub-systems for the Radiation Hardness Assurance (RHA)
of their electronics. This co-ordination is
made in the framework of
the
ATLAS Radiation Hardness Assurance Working Group
(RHA-WG). This working group was organised in 1999 in the
framework of the ATLAS Technical
Co-ordination, with the task of developing and operating a coherent plan
for radiation hardness assurance in all the
sub-systems. The members
of this working group are:
- The
ATLAS
Radiation Hardness Assurance co-ordinator;
- The
Radiation
Hardness Assurance leaders from each ATLAS subsystems;
- The
ATLAS
Front-End Electronics co-ordinator.
This working group meets
every 3-4 months; its progress reports (minutes)
are published in this Web Page.
3. A set of common rules and standard tools
(strategy for electronic components procurement,
simulated
radiation levels, safety
factors and
radiation
tolerance criteria, standard
radiation test methods, lists of radiation
facilities, standard test reports,
electronic
components data base, etc.)
agreed and used by the subsystems
for pre-selecting generic components and for qualifying and purchasing
batches of components. These rules and
tools have been developped
by the RHA co-ordinator in collaboration with the RHA leaders from the
sub-systems, and agreed by ATLAS Technical
Coordination. They are summarized
in the ATLAS
Policy on Radiation Tolerant Electronics revision 2 available on this
web page.
An Overview
of the ATLAS Policy on Radiation Tolerant Electronics, published in
the proceedings of the 6th Workshop on Electronics for LHC experiments
(September 2000, Cracow),
is available on this web page.
The electronic components
to be installed on the ATLAS detector or in the UX15 cavern will be radiation
tolerant COTS components ("Commercial
Off The Shelf") or
radiation-hard ASICs. The ATLAS strategy for procurement of these components
is the following:
1. Procurement of radiation tolerant COTS components:
Step 1:
Listing of all the radiation tolerant COTS components required by ATLAS
sub-systems;
Step 2:
Calculation of the Radiation
Tolerance Criteria (RTC) for accepting components for use in a given
ATLAS location;
Step 3:
Pre-selection of the generic components (identified by their part number
and manufacturer) which may satisfy the RTC. This requires
radiation tests based on ATLAS
standard test methods. Test results are written in Standard
Test Reports and put on the ATLAS
Electronic Components Data
Base.
Step 4:
Qualification of batches of components to be mounted in ATLAS electronic
systems. This requires radiation tests based on ATLAS
standard
test methods.
Step 5:
Purchase of qualified batches of components.
2. Procurement of radiation hard ASICs:
Step 1:
Listing of all the radiation hard ASICs required by ATLAS sub-systems;
Step 2:
Calculation of the Radiation
Tolerance Criteria (RTC) for accepting components for use in a given
ATLAS location;
Step 3:
Selection of a technology whose radiation hardness complies with RTC.
Step 4:
Design of the ASICs using the selected radiation hard technology, or using
a radiation-soft technology (for prototyping) plus a translation of
advanced prototypes into the selected radiation hard technology.
Step 5:
Qualification of the radiation hardness of the final prototype designed
with the radiation hard technology. This requires radiation tests based
on ATLAS
standard test methods. The robustness of the ASICs with respect to
the standard variations of the process must be checked by
worst case simulations and also by processing actual corner runs, if necessary.
Final test results shall be written in Standard
Test Reports
and put on the ATLAS
Electronic Components Data Base.
Step 6:
Purchase of pre-series and series batches of ASICs manufactured with the
radiation hard technology. Each batch must be accompanied by a
certificate of conformity in which the manufacturer guarantees that all
the guaranteed electrical and radiation hardness parameters of the batch
have been checked on standard test vehicles and are within the specified
limits. Additional radiation tests may be necessary, depending on the
results obtained on worst case simulations and on corner runs during the
qualification phase.
| Current documents
|
Obsolete documents (archives)
|
Contents of the Atlas Policy on Radiation Tolerant Electronics revision 2 :
- ATLAS Strategy for electronic components procurement
;
- ATLAS
Simulated Radiation Levels ;
- ATLAS
Safety Factors ;
- ATLAS
Radiation tolerance criteria ;
- ATLAS
Standard Radiation Test Methods;
- ATLAS Standard Test Report Forms
;
- List of Radiation Facilities
;
- Information on the ATLAS Electronic Components
Data Base
Operating the Policy
The core of the Policy is the ATLAS Strategy for electronic components procurement, which includes a preselection of generic electronic components and a qualification of batches of components. For pre-selecting generic components and for qualifying batches of components, ATLAS Sub-Systems are invited to compute Radiation Tolerance Criteria first, then to perform radiation tests using the ATLAS Standard Test Methods, to write test results in the Standard Test Reports and to analyse them with the ATLAS RHA co-ordinator. Final test results must be sent to the ATLAS RHA co-ordinator together with other information (see section 6 of this web page) in order to be put into the database.
Remark: before starting radiation tests, it is suggested that ATLAS Sub-systems write a radiation campaign plan and discuss it with the ATLAS RHA co-ordinator.
| 3.1. CURRENT DOCUMENTS
3.1.1. Final Radiation Tables (January 03)
3.1.2. Final Radiation Maps (January 03) Full Detector
Inner Detector
(the above maps and other related are found at the Radiation Background Taskforce Web page) 3.1.3. Final Safety Factors and Simulated Radiation Levels (January 03)
Data are tabulated by zones (cm)
Particles fluxes with their contribution, in energy bins, to Ionization Dose and NIEL 3.1.4. Current Locations of electronic Systems in ATLAS (not verified, refer to dedicated sites for the last cahnges)
|
| 3.2. JUNE02 DOCUMENTS
3.2.1. Radiation Tables (June 02)
3.2.2. Radiation Maps (June 02) Full Detector
Inner Detector
(the above maps and other related are found at the Radiation Background Taskforce Web page) 3.2.3. Safety Factors and Simulated Radiation Levels (June 02)
Data are tabulated by zones (cm) 3.2.4. Locations of electronic Systems in ATLAS
|
3.3. Units for Simulated Radiation Levels
- TID (Total Ionising Dose); unit : Gray;
- NIEL (Non Ionising Energy Loss); unit : 1 MeV equivalent
neutron fluence;
- SEE (Single Event Effects); unit : > total fluence of
hadron having an energy > 20 MeV.
Simulated Radiation Levels have been computed for ATLAS by Mike Shupe, using the GEANT CALOR simulator.
3.4. Radiation Tolerance Criteria
The methods for computing Radiation Tolerant Criteria (RTC)
are given in appendix 1 of the ATLAS
Policy on Radiation Tolerance Electronics. The inputs of these computations
are the simulated Radiation Levels (SRL),
and the Safety Factors (SF)
given above.
| Current documents
Standard Test Methods
Standard Report Forms (.doc Templates)
|
Obsolete documents (archives)
|
Preparation of the tests:
ATLAS Sub-systems are invited to write their radiation campaign plans and discuss them with the ATLAS RHA co-ordinator before starting radiation tests.
Test results:
Test Results must be written in ATLAS Standard Report forms and analysed with the ATLAS RHA co-ordinator. Final test results must be sent to the ATLAS RHA co-ordinator with other information (see section 6 of this web page) in order to be put into the database.
| 5.1. Lists of Radiation Facilities
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5.2. Radiation Campaigns Agenda
5.3. Historical Record of the Radiation Campaigns Agenda
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Coordination of the Radiation Tests
ATLAS Sub-systems are invited to consult the agenda and to consider sharing a radiation facility with other users. In the event that there is no practical possibility of sharing, the sub-systems should contact the facility directly for a reservation (see the contacts given in the list of facilities). After booking a radiation facility, ATLAS Sub-systems are requested to enter the relevant information concerning their tests into the agenda.
| Electronic Components Data Base
|
Template documents for the data base (.doc files):
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Submission of documents to the Data Base
For each type of electronic component which will be located in ATLAS detector or in UX15 cavern, ATLAS Sub-systems are invited to provide by Email the co-ordinator of the ATLAS Radiation Hardness Assurance with the following documents:
1. General
Information (complete General
Information Form.doc)
2. Technical
Data Sheet (1);
3. TID
Test Report (complete Standard
TID test report.doc form whenever possible);
4. NIEL
Test Report (complete Standard
NIEL test report.doc form whenever possible);
5. SEE
Test Report (complete Standard
SEE test report.doc form whenever possible).
(1) For COTS components, provide data sheet from the manufacturer. For ASICs, provide datasheet from the collaboration author of the ASIC.
Please send these documents to the ATLAS RHA
co-ordinator,
as electronic files (.pdf or .doc) whenever possible (templates
available above).
These files will be directly entered in the
ATLAS
Electronic Components Data Base.
7.1. Members:
| Collaboration | Surname | First Name | Institute | Phone | |
| Pixels | *Sicho | Petr | Prague | +420 266 05 21 43 | Petr.Sicho@cern.ch |
| SCT | *Mandic
Anghinolfi Kaplon |
Igor
Francis Jan |
Lubljana
CERN CERN |
+386 1 477 35 35
+41 22 76 90 84 +41 22 767 81 21 |
Igor.Mandic@ijs.si
Francis.Anghinolfi@cern.ch Jan.Kaplon@cern.ch |
| TRT & FE Electronics | *Farthouat | Philippe | CERN | +41 22 767 62 21 | Philippe.Farthouat@cern.ch |
| LARG | *Delataille
Borgeaud Andrieux |
Christophe
Pierre Marie-Laure |
LAL Orsay
CEA Saclay ISN Grenoble |
+33 01 64 46 89 39
+33 01 69 08 61 65 +33 04 76 28 41 28 |
Taille@lal.in2p3.fr
borgeaud@hep.saclay.cea.fr andrieux@isn.in2p3.fr |
| TILE | *Teuscher | Richard | University of Chicago | +41 (0)22 767 85 94 | Richard.Teuscher@cern.ch |
| MUON
CSC
MDT TGC RPC |
*O’Connor
*Richter *Sasaki *Vari |
Paul
Robert Osamu Riccardo |
BNL
MPI Munchen KEK Japan INFN Roma |
+1 631 344 75 77
+49 89 32 354 358 +81 298 64 54 36 +39 649 91 42 43 |
poc@bnl.gov
Robert.Richter@cern.ch sosamu@post.kek.jp Riccardo.Vari@roma1.infn.it |
| Magnet Control | *Tyrvainen | Harri | CERN | +41 22 767 31 61 | Harri.Tyrvainen@cern.ch |
| DCS | *Hallgren | Bjorn | CERN | +41 22 767 34 44 | Bjorn.Inge.Hallgren@cern.ch |
| Crane | *Inigo-Golfin | Joaquin | CERN | +41 22 767 22 37 | Joaquin.Inigo-Golfin@cern.ch |
| Cryogenics | *Kubischta | Werner | CERN | +41 22 767 17 97 | Werner.Kubischta@cern.ch |
| Alarm Systems | *Nunes | Rui | CERN | +41 22 767 28 16 | Rui.Nunes@cern.ch |
| Cooling & Ventilation (JCOV) | *Godlewski | Jan | CERN | +41-22-767 77 86 | Jan.Godlewski@cern.ch |
| Radiation constraint | *Shupe | Mike | Univ. Arizona | +1 520 621 26 79 | Shupe@uazhep.physics.arizona.edu |
| ATLAS TC | *Dentan | Martin | CERN / CEA Saclay | +41 22 767 59 34 | Martin.Dentan@cern.ch |
7.2. Minutes of RHAWG meetings:
| Minutes | Transparencies |
| 1st meeting 03-Sep-99 | . |
| 2nd meeting 07-Dec-99 | . |
| 3rd meeting 10-Feb-00 | . |
| 4th meeting 12-May-00 | . |
| 5th meeting 08-Dec-00 | |
8.1. ATLAS RHA Standard Forms
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8.2. ATLAS RHA Organisation
|
|
8.3. ATLAS Systems RHA Web pages
8.4. Global Progress Reports
| PPT_04_OCT_01 | . |
| . | . |
| . | . |
| . | . |
| . | . |
| . | . |
General
Digest on radiation effects
on electronics components (M.
Dentan):
Course
1.pdf
Digest on radiation effects
on electronics circuits (M.
Dentan)
Course
2.pdf
CERN training on radiation
effects on electronics circuits Here
Introduction to single event effects (SEE)
Computational method for
estimation of Single Event Upset rate in an accelerator environment (CERN
/ F.Faccio, M.Huhtinen) Here
LHCC Electronics Board Workshops
4th Workshop on Electronics
for LHC Experiments - LEB
1998
5th Workshop on Electronics
for LHC Experiments - LEB
1999 - Proceedings
LEB 1999
6th Workshop on Electronics
for LHC Experiments - LEB
2000 - Proceedings
LEB 2000
7th Workshop on Electronics
for LHC Experiments - LECC2001
- Proceedings
8th Workshop on Electronics
for LHC Experiments - LECC2002
- Proceedings
International Conferences on Radiation Effects
Nuclear and Space Symposium
- NSS 2003
Nuclear and Space Radiation
Effect Conference - NSREC
Radiation Effects on Conponents
and Systems - RADECS 2000
; RADECS 2001
RADECS2003
ESA standard test procedures
Document "ESA/SCC
2900.pdf"
Standard TID test procedure (gamma tests).
Document "ESA/SCC
25100_ESA.pdf"
Standard SEE test procedure (Single Event Effects tests)
DSCC standard test procedures (web address Here)
Document "Intro
MIL STD 883.pdf"
Introduction to MIL STD 883 standard test procedures;
Document "MIL
STD 883 changes.pdf"
Recent changes made on MIL STD 883 test procedures;
Document "MIL
STD 883 1017.2.pdf"
Standard NIEL test procedure (neutron tests): see pp. 96-97-98;
Document "MIL
STD 883 1019.5.pdf"
Standard TID test procedure (gamma tests): see p. 7 and subsequent;
ATLAS Working Groups
Detector Power Supplies
Steering Group
DPSSG
Radiation Background Task
Force RBTF
LHC Project
Radiation Working Group
RADWG
CERN RD49
RD49 COTS
page
Radtol RD49 Home
Page
Radtol RD49 Password
Protected Home Page (Contact Alexandro
Marchioro)
Databases
NASA Radiation
Effect and Analysis
NASA Parts
and packaging Program
DTRA Electronics
Radiation Response Information Center
SPUR "COMRAD"
Radiation Database
Commercial rad-hard technologies
TEMIC Web
site
Honeywell Technology Center
Web
site
Commercial standard technologies
Radiation Tolerant XILINX
National SC Web
site