, 
,
| Summary of Radiation Tests | ||||
|---|---|---|---|---|
| Component | Responsible | Non Ionizing Energy Loss (NIEL) | Total Ionizing Dose (TID) | Single Event Effects (SEE) |
| ADC Integrator Card | IFAE Barcelona | YES | YES | YES |
| 3-in-1 Card | EFI Chicago | YES | YES | YES |
| S-LINK & Interface Card | EFI Chicago | YES | YES | YES |
| Mother Boards | EFI Chicago | YES | YES | YES |
| LVL 1 Adder boards | EFRJ Rio | YES | YES | |
| HV-micro boards | Clermont-Ferrand | YES | YES | YES |
| HV-opto boards | Clermont-Ferrand | YES | YES | YES |
| Digitizer boards | Stockholm | YES | YES | Planned/In Progress |